PicoScope 9400 Series
5 GHz Oscilloscope
The PicoSample 4 workspace takes full advantage of your screen or array of screens, allowing you to resize the window to fit any display resolution supported by Windows.
On very high-resolution displays, PicoSample 4 plots more samples to give you an even more detailed view of your data.
You decide how much space to give to the trace display and the measurements display, and whether to open or hide the control menus. The user interface is fully touch- or mouse-operable, with grabbing and dragging of traces, cursors, regions and parameters. In touchscreen mode, an enlarged parameter control is displayed to assist adjustments on smaller touchscreen displays.
To zoom, either draw a zoom window or use the numerical zoom and offset controls. You can display up to four different zoomed views of the displayed waveforms.
“Hidden trace” icons show a live view of any channels that are not visible on the main display.
The interaction of timebase, sampling rate and capture size is normally handled automatically, but there is also an option to override this and specify the relative priorities of these three parameters.
When working with multiple traces, you can display them all on one grid or separate them into two or four grids. You can also plot signals in XY mode with or without additional voltage-time grids. The persistence display modes use color-contouring or shading to show statistical variations in the signal. Trace display can be in either dots-only or vector format and all these display settings can be independent, trace by trace. Custom trace labeling is also available.
Waveform parameters can be measured in both X and Y axes including X period, frequency, negative or positive cross and jitter. In the Y axis measurements such as max, min, DC RMS and cycle mean are available. Measurements can be within a single trace or trace-to-trace such as phase, delay and gain.
Selection of a measurement parameter displays its values, thresholds and bounds on the main display
The PicoScope 9404-05 quickly measures more than 70 fundamental parameters used to characterize non‑return‑to‑zero (NRZ) signals and return-to-zero (RZ) signals.
Up to ten parameters can be measured simultaneously, with comprehensive statistics also shown. The parameters include X-axis measurements such as bit rate and jitter, and Y-axis measurements such as eye height and noise.
PicoSample 4 has a built-in library of over 130 masks for testing data eyes. It can count or capture mask hits or route them to an alarm or acquisition control. You can stress-test against a mask using a specified margin, and locally compile or edit masks.
There’s a choice of gray-scale and color-graded display modes, and a histogramming feature, all of which aid in analyzing noise and jitter in eye diagrams. There is also a statistical display showing a failure count for both the original mask and the margin.
The extensive menu of built-in test waveforms is invaluable for checking your mask test setup before using it on live signals.
The PicoScope 9404-05 supports up to four simultaneous mathematical combinations or functional transformations of acquired waveforms.
You can select any of the mathematical functions to operate on either one or two sources. All functions can operate on live waveforms, waveform memories or even other functions. There is also a comprehensive equation editor for creating custom functions of any combination of source waveforms.
Choose from 60 math functions including:
The Trend function displays the evolution of timing parameters as line graphs whose vertical axes are the value of the parameter, and horizontal axes the order in which the values were acquired. The information obtained from applying timing parameters can then be analyzed using Trend.
The following trend parameters can be used: Period, Frequency, Positive Width, Negative Width, Rise Time, Fall Time, Positive Duty Cycle, Negative Duty Cycle.
Trend effectively measures parameters such as oscilloscope timebase linearity.
All PicoScope 9404-05 can calculate real, imaginary and complex Fast Fourier Transforms and inverse FFTs of input signals using a range of windowing functions. The results can be further processed using the math functions. FFTs are useful for finding crosstalk and distortion problems, adjusting filter circuits, testing impulse responses of systems, and identifying and locating noise and interference sources.
Behind the powerful measurement and display capabilities of the 9404-05 lies a fast, efficient data histogram capability. A powerful visualization and analysis tool in its own right, the histogram is a probability graph that shows the distribution of acquired data from a source within a user-definable window.
Histograms can be constructed on waveforms on either the vertical or horizontal axes. The most common use for a vertical histogram is measuring and characterizing noise and pulse parameters. A horizontal histogram is typically used to measure and characterize jitter.
We supply a comprehensive programmer’s guide that details every function of the ActiveX control. The SDK can control the oscilloscope over the USB or the LAN port.