There are no plans right now for a 75 Ω VNA. However, the PicoVNA 106 and software do support 75 Ω measurement, either:
If you are working with 75 Ω systems you may already have a suitable port impedance adaptor and cal kit.
Time domain network analysis and frequency domain network analysis are very similar measurements. The former applies a spectrum of discrete frequencies to the unknown network: a step or impulse incident waveform is applied and an oscilloscope or sampling head captures the reflected and transmitted waveforms. The latter applies a series of discrete frequencies and captures reflected and transmitted amplitude and phase using phase-sensitive (IQ) receivers.
The frequency domain VNA approach has better dynamic range because the applied power at each frequency can be constant and relatively high, and the receivers can have restricted noise bandwidth.
TDR/TDT can theoretically be quicker because a single step or impulse could give all necessary information. However, the high sampling-time resolution required by this method tends to call for a sequential sampling oscilloscope such as the PicoScope 9311. This captures only one sample point on each cycle of a step or impulse, so only repeating signals can be tested. Even so, our TDR or TDT solution is still slightly quicker than the VNA. See below regarding multiple forward, reverse, transmission and reflection measurements.
Not at present, but we would be interested to know your requirements.
The SMA and PC3.5 connectors on the PicoVNA 106 make ideal relatively low-uncertainty ports from which to port-adapt both to the larger format and legacy interfaces and to the emerging smaller format and point-contact interfaces. In many cases, port adaptors can achieve sufficiently low measurement uncertainty for systems with connector types of poorer repeatability, and in other applications where performance is not limited by the connector.
Where measurement demands are high, you may be able to obtain port adaptors with either de-embed data or reference plane offset values; both these correction mechanisms being supported by the PicoVNA 106. In the absence of data, you can purchase a mating pair of port adapters such as PC3.5(f/m) to N(m) and PC3.5(f/m) to N(f). Mate the pair at the N-ports and measure them, then attribute half of the transmission parameters and an average of the reflection parameters to each. This is often how the manufacturer measures adaptors that are provided with data.
Ideally, the adapted ports would be calibrated with port-matching cal kits. These are available from a range of suppliers.
Likewise, within-series and adapting test leads are even more widely available than cal kits. However, it seems likely that emerging small-format connectors will demand a lighter-gauge, more flexible test lead or a flexible port adaptor. Please let us know if you have special requirements in this area.
No, it does not.
In most circumstances a vector network analyzer stimulates a device port in signal frequency steps and measures all the ports at the same frequency steps. However, there are applications where you need to measure at harmonics of the stimulus. There are also applications, around frequency mixer devices, where you need to measure at a frequency (the intermediate frequency, or IF) that is offset from the stimulus. This requires more hardware capability than is present in the PicoVNA 106 and thus is not supported.
From the specification we have:
Be careful when comparing with competitors, as they tend only to quote figures for the single-point single sweep. That compares with our faster figure above and not with the slightly longer time for a forward and reverse sweep necessary for a full set of S-parameters. This product is amongst the faster units available. See the competitive comparison on the web site under the Reviews tab.
The sweep speed reduces according to bandwidth settings as the measurement at the output of bandwidth filter has to settle to its full accuracy.
If we first set a 10,001 pt sweep, the forward/reverse switch is proportionally less of an interruption and we can estimate its duration from the two trace lengths that we have.
At 140 kHz 170 us / pt for full s2p (two sweeps):
Testing at other bandwidths for 10k point sweeps:
Think of a modern communications protocol and the amplitude/phase constellation that it uses to represent data. For instance, here's a QAM constellation:
Each of these data codes is transmitted and received on an RF signal or carrier with an amplitude and a phase.
When we send such a signal through any amplifier, but particularly a transmitting power amplifier, distortions will lead to problems.
If the amplifier is operated towards its peak power capability, non-linearity, usually compression, will cause the long vectors in the diagram (above) to end up shorter than they should be, the shorter vectors less affected. The corners will move inwards. If the degree of compression is –1 dB compared with a fully linear amplifier, our vector length will be down around 10%.
This is a single point on a curve, but it helps to understand the whole curve. Our P1dB utility plots this curve at a given frequency by sweeping the input power to the device:
If at the same point, or any other amplitude, the phase of the signal shifts, those constellation points will be affected. Generally again, the high-power ones will move around the circumference of a circle. When this phase shift is amplitude- (vector length) related we have phase modulation due to amplitude modulation or AM to PM conversion. The outer constellation points move around a circle, the inner ones less so and the constellation becomes twisted.
Clearly these amplifier distortions are important, and can be critical in any modulated RF system more advanced than Morse Code - even FM to a degree. If a data code is too far misplaced, it cannot be recognized and corruption occurs. Once an amplifier or any potentially nonlinear element has been characterized for these distortions, it will either be used within its limitations or, much more commonly now, the input will be predistorted to compensate the device. Why? To save battery life! We need to drive low-power amplifiers as far into compression as we possibly can. It is hard to imagine just how much work has been done in this area!
One further point. A great many comms signals hop around the carrier frequency, and the distortions in a device vary with frequency. That is why our P1dB utility can perform the measurement at up to 201 different frequencies in a sweep of frequency and power.
Our recommendation is 1 Nm for stainless steel connectors of type N, SMA or PC3.5 as supplied by us. We offer two torque wrench accessories with our recommended setting:
If mating to gold-plated brass, you should use a reduced torque of around 0.56 Nm to avoid damage to the softer connector. A wrench with this torque setting is readily available from other suppliers.
TRL (through-reflect-line) calibration is a complex subject. TRL calibration and de-embedding are two separate mechanisms for the removal of fixture errors within a measurement. In fact there are at least five mechanisms that may be appropriate, depending upon the fixture, its errors, the measurement and the accuracy required:
The PicoVNA 106 supports mechanisms (1), (2), (1)+(2) and (4).
Despite having the time-domain function available, we do not have the gating function that would support (3). Nor do we support (5) in its many complex forms that in practice become necessary.
Our User's Guide has some good background and of course instruction in the use of reference plane shift, normalization and de-embedding. This will help you to decide which method is most appropriate to your application.
If you have to apply de-embedding to your measurement, there are two options for the derivation of the de-embed s-parameter files. Most commonly a simulation model of the feedlines would be used. You might also have a measurement option. If the feedline and launch points are geometrically identical, for instance, you might measure Port 1 and 2 feeds as a through pair and attribute half of the transmission parameters and an average of the mismatch parameters to each. The choice depends on the details of your fixture, your available fixture test pieces and your application.