Since 1991 we have been supplying the world with test and measurement equipment. At Pico we realize that your choice of test accessories can be almost as important as your choice of test equipment. Here you can purchase a variety of test and measurement accessories quickly and securely online.
Pico Technology presents a unique Inline Probing System – the TETRIS® active probe. The unique design of the TETRIS 1500 active probe allows for contact to adjacent square pins in 2.54 mm pitch simultaneously. This is possible due to the probe's T-shaped housing allowing many probes to be positioned next to each other, permitting multiple measurements to be taken at the same time.
The TETRIS 1500 is independent of any particular system, and with its standard BNC connector and SMA adaptor, it can be plugged into any measuring instrument with a 50 Ω input. With an input resistance of 1 MΩ and an input capacitance of 0.9 pF the TETRIS 1500 probe is suitable for measurements in all frequency ranges. Unlike passive probes, the TETRIS 1500 active probe offers a high input impedance into the GHz range. These characteristics make it the ideal probe for most of your daily measurements.
If the measuring instrument does not have 50 Ω coupling, an external 50 Ω terminator can be used (such as a TA051), but the system bandwidth may be reduced.
The TETRIS 1500 probe is shipped with a comprehensive set of accessories and durable soft pouch for safe storage.
|TA222 TETRIS 1500 Active High Z probe specifications|
|Input impedance||1 MΩ || 0.9 pF|
|Input coupling of the measuring instrument||50 Ω|
|Probe bandwidth (–3 dB)||1.5 GHz|
|System bandwidth (–3 dB)||1000 MHz (*)|
|Input dynamic range||±8 V|
|Max. input voltage||20 V|
|Cable length||1.3 m|
|Supply voltage||Power supply included|
|Altitude||Operating: up to 2000 m
Storage: up to 15 000 m
|Temperature range||Operating: 0° C to +45° C
Storage: –40° C to +71° C
|Maximum relative humidity (operating)||80 % relative humidity for temperatures up to +31 °C, decreasing linearly to 40 % at +50 ° C|
(*) with >500 MHz oscilloscope